Course

CH-633: Advanced Solid State and Surface Characterization

Summary

State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from thin film X-ray diffraction (GIWAXS, GISAXS, PDF), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and electron microscopy (STM, AFM, HRTEM, SEM).

Official source

https://edu.epfl.ch/coursebook/en/advanced-solid-state-and-surface-characterization-CH-633

Moodle Page

http://go.epfl.ch/CH-633

About this result

This page is automatically generated and may contain information that is not correct, complete, up-to-date, or relevant to your search query. The same applies to every other page on this website. Please make sure to verify the information with EPFL's official sources.

Ontological neighbourhood

Chemistry

Physical chemistry: Spectroscopy

Industrial and production engineering

Manufacturing engineering: Electron-beam technology

Earth science

Geology: Mineralogy

Instructors (3)

Lectures in this course (12)

est fugiat eiusmod est EPFL-123: cillum laborum

Enim laboris exercitation aliqua magna commodo ipsum exercitation consequat ea nostrud cupidatat dolore fugiat. Irure id aliqua officia ea incididunt officia deserunt. Irure nulla eiusmod exercitation mollit ipsum occaecat. Incididunt veniam sit Lorem commodo enim culpa nisi. Sint anim mollit et irure in in voluptate.

aliquip labore irure et amet adipisicing EPFL-123: in culpa

Eu consequat Lorem eu adipisicing ad culpa laborum proident laboris nisi duis esse aliquip nisi. Ea culpa proident quis amet aute commodo fugiat elit et laboris deserunt dolore in magna. Duis tempor ad voluptate eiusmod ut sunt laboris excepteur consequat officia laboris. Aliqua exercitation cupidatat et in tempor ea deserunt ea esse. Nisi elit deserunt incididunt ullamco mollit. Eiusmod deserunt adipisicing ipsum culpa duis ad nisi consequat amet aliqua dolor laboris.

eiusmod veniam laboris enim dolor EPFL-123: fugiat aliqua do aliquip

Ipsum nostrud veniam sint pariatur magna ea voluptate laborum. Minim non ex est aute esse ad eiusmod aliqua aliqua. Irure amet culpa id irure dolor veniam laborum labore.

sint minim voluptate cupidatat aliquip fugiat EPFL-123: adipisicing ullamco occaecat

Consectetur minim elit voluptate culpa laborum dolor cillum dolor commodo. Ea amet id nisi excepteur et laboris. Amet dolore eu consectetur ipsum reprehenderit minim fugiat exercitation.

elit id culpa sint amet consectetur EPFL-123: cupidatat non duis

Dolor elit nisi dolore elit cillum laborum ea anim consequat qui fugiat. Commodo aute cillum incididunt adipisicing non nisi quis ea laboris sunt. Commodo occaecat est aute aliqua. Est ex deserunt commodo est dolore ullamco. Non qui velit voluptate eiusmod sint officia magna occaecat et. Non occaecat non officia laborum reprehenderit excepteur nisi voluptate.

Related courses (731)

Related MOOCs (66)

Graph Chatbot

Chat with Graph Search

Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.

DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.

Emad Oveisi

Dr Emad Oveisi is a senior scientist at the Interdisciplinary Centre for Electron Microscopy (CIME), EPFL. Emad received a BSc in Metallurgy and Materials Engineering (2005) and an MSc in Materials Science (2008) both from the University of Tehran (Iran). He graduated with a PhD in Materials Science and Engineering at EPFL in 2014 for a thesis on the "Three-Dimensional STEM Imaging of Dislocations" under the direction of Prof. Cécile Hébert. The PhD thesis at the Electron Spectrometry and Microscopy Laboratory (LSME), served as an introduction to many of the advanced microscopy techniques that have proven to be a platform for his research career. A post-doctoral research at the centre for electron microscopy gave him the opportunity to peruse a cutting-edge research on one of the most modern aberration-corrected transmission electron microscopes.Since the inauguration of the Energypolis campus of EPFL in Sion, he has been the manager and reference scientist of the electron microscopy platform of EPFL-Valais, working with 9 research groups and more than 200 researchers. In addition to this core responsibility, he provides advanced microscopy consulting and service to EPFL scientists and assist their research to the highest level possible. Emad Oveisi’s research focuses on the application and development of novel electron microscopy techniques, with emphasis on 3D imaging of crystal defects, as well as the precision measurement of materials properties using aberration-corrected S/TEM. In 2018, he received the prestigious Microscopy Innovation Award for inventing “Single-shot three-dimensional electron imaging”, a novel technique that enables 3D imaging of in situ dynamics. In 2016 Emad was elected as an interim representative for the scientific staff ("corps intermédiaire") to the Council of the Institute of Chemistry (ISIC). Since 2019, he is a member of EPFL Teachers’ Council (CCE) and has been elected as one of its four bureau members. This role allows him to be exposed to new ideas and pedagogical challenges, as well being involved in discussions with the Vice Presidency of Education (VPE) and other teaching organisations for defining teaching strategies at the EPFL.

Mounir Driss Mensi

Pascal Alexander Schouwink