Publications associées à Wanted: A standard for virtual patent marking

Model uncertainties in action effects and load bearing capacity calculation in statically indeterminate reinforced concrete structures

Aurelio Muttoni, Alain Nussbaumer, Xhemsi Malja

For the dimensioning and assessment of structures, it is common practice to compare action effects with sectional resistances. Extensive studies have been performed to quantify the model uncertainty on the resistance side. However, for statically indetermi ...

Ernst & Sohn2024

Toward Reliable Human Pose Forecasting With Uncertainty

Alexandre Massoud Alahi, Saeed Saadatnejad, Taylor Ferdinand Mordan, Parham Saremi

Recently, there has been an arms race of pose forecasting methods aimed at solving the spatio-temporal task of predicting a sequence of future 3D poses of a person given a sequence of past observed ones. However, the lack of unified benchmarks and limited ...

2024

ZigZag: Universal Sampling-free Uncertainty Estimation Through Two-Step Inference

Nikita Durasov, Minh Hieu Lê, Nik Joel Dorndorf

Whereas the ability of deep networks to produce useful predictions on many kinds of data has been amply demonstrated, estimating the reliability of these predictions remains challenging. Sampling approaches such as MC-Dropout and Deep Ensembles have emerge ...

2024

Writing and Drawing Inventions: Patents and Technology in France and the United States (18th-19th centuries)

Jérôme Baudry

Description (through texts, images, models or samples) played a central role in the patent regimes that emerged in the eighteenth century, first in England, later in the United States and in France. Description ensured that the contract—protection in excha ...

2023

Economic Effect of Patents and the Patent System: Insights from Linked Patent-Product Data

George Abi Younes

This thesis investigates the economic effect of patents and the patent system through the lens of patent commercialisation. The thesis is composed of four chapters, where each chapter is an independent scientific paper. In the first chapter, we present a ...

EPFL2023

Technology Protectionism and the Patent System: Evidence from China

Gaétan Jean A de Rassenfosse, Emilio Raiteri

Governments have strong incentives to allow their inventors to free ride on foreign technologies. They can achieve this result by discriminating against foreigners in the patent system-by refusing to grant foreigners a patent for their inventions. Internat ...

WILEY2022

Limiting the impact of supply chain disruptions in the face of distributional uncertainty in demand

Ralf Seifert, Anna Timonina-Farkas, René Yves Glogg

Service-level requirements play a crucial role in eliminating stock-outs in a production pipeline. However, delivering a specific service level can become an unattainable goal given the various uncertainties influencing both the production pipeline and cus ...

WILEY2022

Strategic Citation: A Reassessment

Kenneth Younge, Jeffrey Kuhn

The United States patent system is unique in that it requires applicants to cite documents they know to be relevant to the examination of their patent applications. Lampe (2012) presents evidence that applicants strategically withhold 21-33% of relevant ci ...

2021

On the numerical simulation of a confined cavitating tip leakage vortex under geometrical and operational uncertainties

Mohamed Farhat

The effects of operational and geometrical uncertainties on Tip Leakage Vortex (TLV) characteristics are investigated in the current research. Geometrical uncertainties are comprised of manufacturing tolerances or gradual geometry degradation over the time ...

PERGAMON-ELSEVIER SCIENCE LTD2021

Theoretical minimum uncertainty of single-molecule localizations using a single-photon avalanche diode array

Edoardo Charbon, Claudio Bruschini, Paul Mos, Arin Can Ülkü, Daniel Fan

Single-photon avalanche diode (SPAD) arrays can be used for single-molecule localization microscopy (SMLM) because of their high frame rate and lack of readout noise. SPAD arrays have a binary frame output, which means photon arrivals should be described a ...

OPTICAL SOC AMER2021