Atomic Force Microscope: Control and Sensitivity Analysis

In course

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Description

This lecture covers the control and sensitivity analysis of an Atomic Force Microscope, focusing on reducing sensitivity to noise at resonant frequency, minimizing response time, and improving tracking performance by adjusting gain. It also discusses notch filters and the impact of phase drop on resonance. The instructor emphasizes the importance of high gain for reducing sensitivity at resonance.

Instructors (2)

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Official source

https://mediaspace.epfl.ch/media/0_0paax3rl

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