This lecture covers the principles of Convergent Beam Electron Diffraction (CBED), focusing on imaging modes, dynamical scattering, and 2-beam conditions. Emad Oveisi explains how CBED provides detailed crystal structure information, including 3D crystal structure, thickness measurement, and polarity. The lecture also discusses the sensitivity of CBED patterns to lattice plane orientation and the use of CBED for measuring sample thickness. Various examples and simulations are presented to illustrate the concepts discussed.