Lecture

Noise in Electronic Devices

Description

This lecture covers the analysis of thermal noise in a MOS Transistor, the equivalent input noise of a MOS Transistor, 1/f input noise, input-referred noise of a bipolar transistor, and input-referred voltage and current noise measurement. It also discusses the noise in common-source amplifier stages, common-source with current source load, common-source with cascode stage, current mirror, differential pair, and opamp. The lecture concludes with noise calculation methods, emphasizing the importance of understanding noise in bioelectronics and biomedical microelectronics.

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