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This lecture introduces the concept of dynamical scattering in Transmission Electron Microscopy (TEM), focusing on multiple elastic scattering and 2-beam electron diffraction. The slides cover topics such as single scattering, strong multiple elastic scattering, 2-beam dynamical scattering amplitude, Bloch wave theory, and dynamical scattering intensity. The instructor explains the Bloch wave solution of Schrödinger equation, the modulation of plane waves by lattice potential, and the intensity as a function of excitation error. The summary highlights 'rocking curves' and the strong interactions in TEM due to dynamical scattering, emphasizing the simple functions governing specimen thickness, excitation error, and extinction distance.