Surface Characterization: SPM, Raman & IR

This lecture covers the surface characterization techniques of Scanning Probe Microscopy (SPM) and vibrational spectroscopy, focusing on Raman and Infrared (IR) spectroscopy. It explains the modes of operation of AFM, including contact, non-contact, and tapping modes. The lecture delves into the principles of contact and tapping mode AFM, discussing the interaction forces, artifacts, and calibration. It also explores examples of statistical properties and step height measurements. Additionally, it touches on the quantum mechanical description of molecular vibrations, the Morse potential, and the degree of freedom in molecular vibrations. The lecture concludes with discussions on IR and Raman spectroscopy, molecular origins of IR absorption and Raman scattering, and the selection rules and intensities of scattering processes.