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Scanning near-field optical microscopy (SNOM) is an optical microscopy whose resolution is not bound to the diffraction limit. It provides chemical information based upon spectral, polarization and/or fluorescence contrast images. Details as small as 20 nm can be recognized. Photophysical and photochemical effects can be studied with SNOM on a similar scale. This article reviews a good deal of the experimental and theoretical work on SNOM in Switzerland.
Aleksandra Radenovic, Wayne Yang Wen Wei, Khalid Ashraf Mohie Ibrahim, Helena Miljkovic, Akhil Sai Naidu
Sandor Kasas, María Inés Villalba, Priyanka Parmar