Publication
Preparation of homogeneous titania coating on the surface of MWNT
Abstract
Preparation of homogeneous and stable inorganic coatings on the surface of multi-wall carbon nanotubes (CNTs) was studied. Precursor compounds such as titanium (IV) bromide and titanium (IV) chloride were used to cover the surface of CNTs under either solvent-free or solution conditions. As-prepared titania layers were characterized by transmission, scanning electron microscopy and X-ray diffraction techniques. Results revealed that homogenous coverage can be achieved in a controllable way. (C) 2010 Elsevier Ltd. All rights reserved.
Official source
About this result
This page is automatically generated and may contain information that is not correct, complete, up-to-date, or relevant to your search query. The same applies to every other page on this website. Please make sure to verify the information with EPFL's official sources.
Ontological neighbourhood
Related concepts (22)
Scanning electron microscope
A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image.
Electron microscope
An electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light, electron microscopes have a higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes.
X-ray scattering techniques
X-ray scattering techniques are a family of non-destructive analytical techniques which reveal information about the crystal structure, chemical composition, and physical properties of materials and thin films. These techniques are based on observing the scattered intensity of an X-ray beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength or energy.
Related publications (65)
Structural study of nickelate based heterostructures
Duncan Thomas Lindsay Alexander, Chih-Ying Hsu, Bernat Mundet, Jean-Marc Triscone
Heterostructures consisting of SmNiO3 and NdNiO3 alternating layers with additional LaAlO3 spacer layers were grown and fully characterized by means of x-ray diffraction, atomic force microscopy, and scanning transmission electron microscopy. A change in t ...
Melville2024Effect of Mo addition on the mechanical and tribological properties of magnetron sputtered TiN films
Ternary-based titanium nitride (TiN) thin films have drawn attention toward rational applications due to their wear resistance, high hardness, and corrosion resistance. The influence of Mo content on the structural, tribo-logical, and mechanical properties ...
ELSEVIER SCIENCE SA2023Stable Ta2O5 nanotubes decorated by PbS by the SILAR method for photocatalytic dye degradation
Tantalum oxide Ta2O5 nanotubes (NTs) were prepared by electrochemical anodization and were decorated with lead sulfide nanoparticles PbS (NPs) by Successive Ionic Layer Adsorption and Reaction commonly known as the SILAR method. The PbS NPs/Ta2O5 NTs were ...
2023Related MOOCs (15)
Transmission Electron Microscopy for Materials Sciences
Learn about the fundamentals of transmission electron microscopy in materials sciences: you will be able to understand papers where TEM has been used and have the necessary theoretical basis for takin
Transmission Electron Microscopy for Materials Sciences
Learn about the fundamentals of transmission electron microscopy in materials sciences: you will be able to understand papers where TEM has been used and have the necessary theoretical basis for takin
Synchrotrons and X-Ray Free Electron Lasers (part 1)
Synchrotrons and X-Ray Free Electron Lasers (part 1)