Course

MSE-628: CCMX Advanced Course - Advanced X-ray Diffraction Methods for Coatings: strain, defects and deformation analysis of thin films

Summary

After introducing thin film and HR-XRD characterisation methods, theory and limitations are discussed, including examples and how the film structure influences its characteristics. Protocols are presented for establishing reproducible and reliable measurements, and for interpreting their results.

Official source

https://edu.epfl.ch/coursebook/en/ccmx-advanced-course-advanced-x-ray-diffraction-methods-for-coatings-strain-defects-and-deformation-analysis-of-thin-films-MSE-628

Moodle Page

http://go.epfl.ch/MSE-628

About this result

This page is automatically generated and may contain information that is not correct, complete, up-to-date, or relevant to your search query. The same applies to every other page on this website. Please make sure to verify the information with EPFL's official sources.

Instructor

Graph Chatbot

Chat with Graph Search

Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.

DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.