Explores Built-In Self-Test (BIST) techniques in VLSI systems, covering benefits, drawbacks, implementation details, and the use of Linear Feedback Shift Registers (LFSRs) for test pattern generation.
Explores real-time control systems, determinism, and automation in critical systems, emphasizing the significance of meeting time constraints for safety and efficiency.
Explores how AI/ML is shaping the future workplace, focusing on enterprise systems and processes, and discusses the current state of AI/ML adoption in enterprises.
