Kelvin probe force microscope

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Scanning Probe Microscopy: Forces, Tips, and Probes

Explores the forces, tips, and probes used in Scanning Probe Microscopy, focusing on AFM principles, tip resolution limits, and cantilever probe fabrication.

Microfabrication Techniques: Tips and Sensors

Explores microfabrication techniques for nanotips and sensors, contact modes in AFM, capillary forces, and integrated sensors and actuators.

Nanomagnetic Imaging Techniques

Explores nanomagnetic imaging techniques for studying skyrmion crystals, edge currents, 2D materials, and correlated states.

Scanning probe microscopy: basics

Covers the basics of Scanning Probe Microscopy, focusing on STM and AFM, explaining principles, imaging techniques, and spectroscopy methods.

Microscopy: General Aspects and Techniques

Covers general aspects and techniques of microscopy, emphasizing resolution importance and exploring scanning tunneling and atomic force microscopy.

Scanning Probe Microscopy: Basics and Applications

Explores scanning probe microscopy fundamentals, tip types, and AFM modes for nanoscale imaging and manipulation.

Magnetic Materials in Modern Technologies

Covers magnetic materials in modern technologies, including simulation, microscopy, and practical exercises.

Atomic Force Microscopy: Tip-Sample Interactions

Explores tip-sample interactions in AFM, covering hysteresis, contact and non-contact modes, feedback mechanisms, and image resolution.

Microscopic Analyses & Electron Sources

Covers microscopic analyses using optical and electron microscopy, as well as electron sources.

Microscopy at Nanoscale: Techniques and Applications

Covers resolution enhancement in optical microscopy, confocal imaging, and fluorescent labelling, exploring the history and techniques of scanning probe microscopy.