Concept

Kelvin probe force microscope

Related publications (223)

Alleviating nanostructural phase impurities enhances the optoelectronic properties, device performance and stability of cesium-formamidinium metal-halide perovskites

Christophe Ballif, Aïcha Hessler-Wyser, Quentin Thomas Jeangros, Christian Michael Wolff, Daniel Anthony Jacobs, Austin George Kuba, Mostafa Rabie Shlaly Bahr Othman, Beat Ruhstaller, Anaël Morgane Jaffrès

The technique of alloying FA+ with Cs+ is often used to promote structural stabilization of the desirable alpha-FAPbI3 phase in halide perovskite devices. However, the precise mechanisms by which these alloying approaches improve the optoelectronic quality ...

Royal Soc Chemistry2024

Resonant Tip-Enhanced Raman Spectroscopy of a Single-Molecule Kondo System

Jiri Dolezal

Tip-enhanced Raman spectroscopy (TERS) under ultrahigh vacuum and cryogenic conditions enables exploration of the relations between the adsorption geometry, electronic state, and vibrational fingerprints of individual molecules. TERS capability of reflecti ...

Amer Chemical Soc2024

Advances in High-Speed, Multiparametric Atomic Force Microscopy

Santiago Harald Andany

After decades of technological advancements, high-speed atomic force microscopy (HS-AFM) has emerged as a powerful technique for visualizing dynamic processes. At the nanoscale, the AFM provides valuable insights into the sample by sensing minute interacti ...

EPFL2024

Nanolithography of the nanocorral structure of chemisorbed oxygen atoms on the graphitic lattice

Kumar Varoon Agrawal, Shaoxian Li

Controlled atomic patterning is an attractive tool to fine tune properties of graphitic lattice. Several O-functionalized derivatives of graphitic lattice have been widely studied, e.g., graphene oxide, reduced graphene oxide, and functionalized carbon nan ...

Oxford2024

Advancing atomic force microscopy through open source instrumentation

Mustafa Kangül

Atomic force microscopy (AFM), a member of the scanning probe microscopy (SPM) family, holds a unique position as a nano-characterization instrument in the fields of physics, chemistry, and biology. Its ability to provide atomic resolution and operate in v ...

EPFL2023

Atomic-scale Characterization of Strain and Gate effects on Two-dimensional Materials by Scanning Tunneling Microscopy

Jz -Yuan Juo

Strain is an inevitable phenomenon in two-dimensional (2D) material, regardless of whether the film is suspended or supported. Moreover, strain is known to alter the physical and chemical properties, such as the band gap, charge carrier effective masses, d ...

EPFL2023

A diamond spin qubit scanning probe microscope

Dinesh Kevin Mathais Pinto

The properties of a physical system only exist in relation to its environment. This thesis presents the development of a novel spin qubit scanning probe microscope operating over a wide range of environmental conditions. The qubit, which sits at the heart ...

EPFL2023

Nanoscale local modification of PMMA refractive index by tip-enhanced femtosecond pulsed laser irradiation

Mihai Adrian Ionescu

Tip-enhanced optical effects have enabled a wide palette of nanoscale investigation techniques and recently they were successfully used to modify and manipulate matter with nanoscale spatial resolution. We contribute to this latter area by reporting a viab ...

ELSEVIER2023

Magnetic force microscopy contrast formation and field sensitivity

Johannes Schwenk

The magnetic force microscope (MFM) is an established experimental tool for imaging stray fields with high spatial resolution and sensitivity. The MFM contrast can however contain contributions from the sample topography, variations in the surface Kelvin p ...

2022

Active load cell with positive, negative and zero stiffness operating modes for micronewton range contact force monitoring in electrical probing

Simon Nessim Henein, Charles Baur, Hubert Pierre-Marie Benoît Schneegans, Michal Stanislaw Smreczak

This article describes a novel method for applying a contact force in the range of 1 to 100 μN with pointed probe on a microscale sample in order to perform ohmic electrical measurements. The solution is based on the new TIVOT active load cell combining th ...

2022

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