Explores the behavior of capacitors, electrostatic potential energy, and forces on dielectric materials.
Explores capacitance, dielectrics, and energy storage in capacitors, including pressure sensor applications and the impact of dielectric materials.
Explores the failure mechanisms in MEMS devices, including creep, fatigue, and electrical failures, and discusses mitigation strategies.
Explores capacitors with dielectric materials, analyzing energy storage and potential difference, demonstrating practical applications through a discharging demonstration.
Covers the MOS I/V characteristics, including triode and saturation regions, deep triode, and second-order effects.
