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Explores the components and operation of a Transmission Electron Microscope (TEM), including vacuum systems, electron sources, lenses, aberrations, and detectors.
Explores the construction and key concepts of Digital Systems, including binary representation, hardware-software differences, and implementation options.
Explores optical aberrations in microscopy, including spherical, chromatic, coma, astigmatism, and more, impacting image quality and correction methods.
Explores the transformation of spherical waves into converging ones using lenses and discusses Gaussian beams' properties and focusing of thermal sources.
