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Time of flight (ToF) is the measurement of the time taken by an object, particle or wave (be it acoustic, electromagnetic, etc.) to travel a distance through a medium. This information can then be used to measure velocity or path length, or as a way to learn about the particle or medium's properties (such as composition or flow rate). The traveling object may be detected directly (direct time of flight, dToF, e.g., via an ion detector in mass spectrometry) or indirectly (indirect time of flight, iToF, e.g., by light scattered from an object in laser doppler velocimetry). In electronics, one of the earliest devices using the principle are ultrasonic distance-measuring devices, which emit an ultrasonic pulse and are able to measure the distance to a solid object based on the time taken for the wave to bounce back to the emitter. The ToF method is also used to estimate the electron mobility. Originally, it was designed for measurement of low-conductive thin films, later adjusted for common semiconductors. This experimental technique is used for metal-dielectric-metal structures as well as organic field-effect transistors. The excess charges are generated by application of the laser or voltage pulse. For Magnetic Resonance Angiography (MRA), ToF is a major underlying method. In this method, blood entering the imaged area is not yet saturated, giving it a much higher signal when using short echo time and flow compensation. It can be used in the detection of aneurysm, stenosis or dissection. In time-of-flight mass spectrometry, ions are accelerated by an electrical field to the same kinetic energy with the velocity of the ion depending on the mass-to-charge ratio. Thus the time-of-flight is used to measure velocity, from which the mass-to-charge ratio can be determined. The time-of-flight of electrons is used to measure their kinetic energy. In near-infrared spectroscopy, the ToF method is used to measure the media-dependent optical pathlength over a range of optical wavelengths, from which composition and properties of the media can be analyzed.

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Related publications (8)

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The neutron time-of-flight (n_TOF) facility at the European Laboratory for Particle Physics (CERN) is a pulsed white-spectrum neutron spallation source producing neutrons for two experimental areas: t

AMER PHYSICAL SOC2021

Multispectroscopic Study of Single Xe Clusters Using XFEL Pulses

Christoph Bostedt, Christophe Nicolas

X-ray free-electron lasers (XFELs) deliver ultrashort coherent laser pulses in the X-ray spectral regime, enabling novel investigations into the structure of individual nanoscale samples. In this work

2019

A Modular, Direct Time-of-Flight Depth Sensor in 45/65-nm 3-D-Stacked CMOS Technology

Edoardo Charbon, Myung Jae Lee, Preethi Padmanabhan, Augusto Ronchini Ximenes

This article introduces a modular, direct time-of-flight (TOF) depth sensor. Each module is digitally synthesized and features a 2

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8) single-photon avalanche diode (SPAD) pixel

2019

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