Concept

Selected area diffraction

Summary
Selected area (electron) diffraction (abbreviated as SAD or SAED) is a crystallographic experimental technique typically performed using a transmission electron microscope (TEM). It is a specific case of electron diffraction used primarily in material science and solid state physics as one of the most common experimental techniques. Especially with appropriate analytical software, SAD patterns (SADP) can be used to determine crystal orientation, measure lattice constants or examine its defects. Principle In transmission electron microscope, a thin crystalline sample is illuminated by parallel beam of electrons accelerated to energy of hundreds of kiloelectron volts. At these energies samples are transparent for the electrons if the sample is thinned enough (typically less than 100 nm). Due to the wave–particle duality, the high-energetic electrons behave as matter waves with wavelength of a few thousandths of a nanometer. The relativistic wavelength is given by
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