Publications related to Bit error rate

Approximation-aware Rewriting of AIGs for Error Tolerant Applications

Approximation circuits offer superior performance (speed and area) compared to traditional circuits at the cost of computational accuracy. The accuracy of the results in approximation circuits is evaluated based on several error metrics such as worst-case ...

Assoc Computing Machinery2016

A 4.1 pJ/b 25.6 Gb/s 4-PAM Reduced-State Sliding-Block Viterbi Detector in 14 nm CMOS

Andreas Peter Burg, Lukas Kull, Thomas Toifl, Giovanni Cherubini

The implementation of a digital four-level pulse-amplitude-modulation reduced-state sliding-block Viterbi detector (VD) with two substates and two embedded per-survivor decision-feedback taps operating at one-eighth of the modulation rate is described. Imp ...

Ieee2016

High-Speed Link With Trellis-Coded Modulation and Reed Solomon Coding

Andreas Peter Burg, Thomas Toifl, Giovanni Cherubini

A high-performance low-latency transmission system based on a concatenated code consisting of inner four-dimensional five-level pulse-amplitude-modulation (5-PAM) trellis-coded modulation and an outer Reed-Solomon (RS) code is proposed for a high-speed dat ...

Ieee2016

Sampling strategies and post-processing methods for increasing the time resolution of organic aerosol measurements requiring long sample-collection times

Satoshi Takahama, Robin Lewis Modini

The composition and properties of atmospheric organic aerosols (OAs) change on timescales of minutes to hours. However, some important OA characterization techniques typically require greater than a few hours of sample-collection time (e.g., Fourier transf ...

Copernicus GmbH2016

Precise error determination of approximated components in sequential circuits with model checking

Mathias Soeken, Arun Chandrasekharan

Error metrics are used to evaluate the quality of an approximated circuit or to trade-off several approximated candidates in design exploration. Precisely determining the error or all approximated circuit is a hard problem since the errors accumulate over ...

ACM/IEEE2016

Statistical Fault Injection for Impact-Evaluation of Timing Errors on Application Performance

Andreas Peter Burg, Georgios Karakonstantis, Jeremy Hugues-Felix Constantin, Anupam Chattopadhyay, Zheng Wang

This paper proposes a novel approach to modeling of gate level timing errors during high-level instruction set simulation. In contrast to conventional, purely random fault injection, our physically motivated approach directly relates to the underlying circ ...

ACM2016

Statistical Fault Injection for Impact-Evaluation of Timing Errors on Application Performance

Andreas Peter Burg, Georgios Karakonstantis, Jeremy Hugues-Felix Constantin, Anupam Chattopadhyay, Zheng Wang

This paper proposes a novel approach to modeling of gate level timing errors during high-level instruction set simulation. hi contrast to conventional, purely random fault injection, our physically motivated approach directly relates to the underlying circ ...

Ieee2016

Computing the Impact of White and Flicker Noise in Continuous-Time Integrator-Based ADCs

Maher Kayal, Adil Koukab, Paul Stanislas Gosselin

From first-order incremental Sigma Delta converters to controlled-oscillator-based converters, many ADC architectures are based on the continuous-time integration of the input signal. However, the accuracy of such converters cannot be properly estimated wi ...

Ieee2016

Chat with Graph Search

Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.

DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.

Bit error rate

Approximation-aware Rewriting of AIGs for Error Tolerant Applications

A 4.1 pJ/b 25.6 Gb/s 4-PAM Reduced-State Sliding-Block Viterbi Detector in 14 nm CMOS

High-Speed Link With Trellis-Coded Modulation and Reed Solomon Coding

Sampling strategies and post-processing methods for increasing the time resolution of organic aerosol measurements requiring long sample-collection times

Precise error determination of approximated components in sequential circuits with model checking

Statistical Fault Injection for Impact-Evaluation of Timing Errors on Application Performance

Statistical Fault Injection for Impact-Evaluation of Timing Errors on Application Performance

Distributed Detection over Adaptive Networks: Refined Asymptotics and the Role of Connectivity

Investigating Cross-lingual Multi-level Adaptive Networks: The Importance of the Correlation of Source and Target Languages

Computing the Impact of White and Flicker Noise in Continuous-Time Integrator-Based ADCs

Graph Chatbot

Chat with Graph Search

Sampling strategies and post-processing methods for increasing the time resolution of organic aerosol measurements requiring long sample-collection times

Statistical Fault Injection for Impact-Evaluation of Timing Errors on Application Performance

Investigating Cross-lingual Multi-level Adaptive Networks: The Importance of the Correlation of Source and Target Languages

Computing the Impact of White and Flicker Noise in Continuous-Time Integrator-Based ADCs

Approximation-aware Rewriting of AIGs for Error Tolerant Applications

Precise error determination of approximated components in sequential circuits with model checking

Statistical Fault Injection for Impact-Evaluation of Timing Errors on Application Performance

Distributed Detection over Adaptive Networks: Refined Asymptotics and the Role of Connectivity