X-ray absorption near edge structure

X-ray absorption near edge structure (XANES), also known as near edge X-ray absorption fine structure (NEXAFS), is a type of absorption spectroscopy that indicates the features in the X-ray absorption spectra (XAS) of condensed matter due to the photoabsorption cross section for electronic transitions from an atomic core level to final states in the energy region of 50–100 eV above the selected atomic core level ionization energy, where the wavelength of the photoelectron is larger than the interatomic distance between the absorbing atom and its first neighbour atoms. Both XANES and NEXAFS are acceptable terms for the same technique. XANES name was invented in 1980 by Antonio Bianconi to indicate strong absorption peaks in X-ray absorption spectra in condensed matter due to multiple scattering resonances above the ionization energy. The name NEXAFS was introduced in 1983 by Jo Stohr and is synonymous with XANES, but is generally used when applied to surface and molecular science. The fundamental phenomenon underlying XANES is the absorption of an x-ray photon by condensed matter with the formation of many body excited states characterized by a core hole in a selected atomic core level (refer to the first Figure). In the single-particle theory approximation, the system is separated into one electron in the core levels of the selected atomic species of the system and N-1 passive electrons. In this approximation the final state is described by a core hole in the atomic core level and an excited photoelectron. The final state has a very short life time because of the short life-time of the core hole and the short mean free path of the excited photoelectron with kinetic energy in the range around 20-50 eV. The core hole is filled either via an Auger process or by capture of an electron from another shell followed by emission of a fluorescent photon. The difference between NEXAFS and traditional photoemission experiments is that in photoemission, the initial photoelectron itself is measured, while in NEXAFS the fluorescent photon or Auger electron or an inelastically scattered photoelectron may also be measured.