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Concept
Mach–Zehnder interferometer
Summary
The Mach–Zehnder interferometer is a device used to determine the relative phase shift variations between two collimated beams derived by splitting light from a single source. The interferometer has been used, among other things, to measure phase shifts between the two beams caused by a sample or a change in length of one of the paths. The apparatus is named after the physicists Ludwig Mach (the son of Ernst Mach) and Ludwig Zehnder; Zehnder's proposal in an 1891 article was refined by Mach in an 1892 article. Demonstrations of Mach–Zehnder interferometry with particles other than photons (particles of light) had been demonstrated as well in multiple experiments.
The versatility of the Mach–Zehnder configuration has led to its being used in a wide range of fundamental research topics in quantum mechanics, including studies on counterfactual definiteness, quantum entanglement, quantum computation, quantum cryptography, quantum logic, Elitzur–Vaidman bomb tester, the quantum eraser experiment, the quantum Zeno effect, and neutron diffraction. In optical telecommunications it is used as an electro-optic modulator for phase and amplitude modulation of light.
The Mach–Zehnder check interferometer is a highly configurable instrument. In contrast to the well-known Michelson interferometer, each of the well-separated light paths is traversed only once.
If the source has a low coherence length then great care must be taken to equalize the two optical paths. White light in particular requires the optical paths to be simultaneously equalized over all wavelengths, or no fringes will be visible (unless a monochromatic filter is used to isolate a single wavelength). As seen in Fig. 1, a compensating cell made of the same type of glass as the test cell (so as to have equal optical dispersion) would be placed in the path of the reference beam to match the test cell. Note also the precise orientation of the beam splitters. The reflecting surfaces of the beam splitters would be oriented so that the test and reference beams pass through an equal amount of glass.
Official source
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