Related concepts (18)
Reflection coefficient
In physics and electrical engineering the reflection coefficient is a parameter that describes how much of a wave is reflected by an impedance discontinuity in the transmission medium. It is equal to the ratio of the amplitude of the reflected wave to the incident wave, with each expressed as phasors. For example, it is used in optics to calculate the amount of light that is reflected from a surface with a different index of refraction, such as a glass surface, or in an electrical transmission line to calculate how much of the electromagnetic wave is reflected by an impedance discontinuity.
Brewster's angle
Brewster's angle (also known as the polarization angle) is an angle of incidence at which light with a particular polarization is perfectly transmitted through a transparent dielectric surface, with no reflection. When unpolarized light is incident at this angle, the light that is reflected from the surface is therefore perfectly polarized. This special angle of incidence is named after the Scottish physicist Sir David Brewster (1781–1868).
Polarization (physics)
Polarization (also polarisation) is a property of transverse waves which specifies the geometrical orientation of the oscillations. In a transverse wave, the direction of the oscillation is perpendicular to the direction of motion of the wave. A simple example of a polarized transverse wave is vibrations traveling along a taut string (see image); for example, in a musical instrument like a guitar string. Depending on how the string is plucked, the vibrations can be in a vertical direction, horizontal direction, or at any angle perpendicular to the string.
Fresnel equations
The Fresnel equations (or Fresnel coefficients) describe the reflection and transmission of light (or electromagnetic radiation in general) when incident on an interface between different optical media. They were deduced by Augustin-Jean Fresnel (freɪˈnɛl) who was the first to understand that light is a transverse wave, even though no one realized that the "vibrations" of the wave were electric and magnetic fields.
Curved mirror
A curved mirror is a mirror with a curved reflecting surface. The surface may be either convex (bulging outward) or concave (recessed inward). Most curved mirrors have surfaces that are shaped like part of a sphere, but other shapes are sometimes used in optical devices. The most common non-spherical type are parabolic reflectors, found in optical devices such as reflecting telescopes that need to image distant objects, since spherical mirror systems, like spherical lenses, suffer from spherical aberration.
Scattering
Scattering is a term used in physics to describe a wide range of physical processes where moving particles or radiation of some form, such as light or sound, are forced to deviate from a straight trajectory by localized non-uniformities (including particles and radiation) in the medium through which they pass. In conventional use, this also includes deviation of reflected radiation from the angle predicted by the law of reflection.
Angle of incidence (optics)
The angle of incidence, in geometric optics, is the angle between a ray incident on a surface and the line perpendicular (at 90 degree angle) to the surface at the point of incidence, called the normal. The ray can be formed by any waves, such as optical, acoustic, microwave, and X-ray. In the figure below, the line representing a ray makes an angle θ with the normal (dotted line). The angle of incidence at which light is first totally internally reflected is known as the critical angle.
Ellipsometry
Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry measures the change of polarization upon reflection or transmission and compares it to a model. It can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties. It is very sensitive to the change in the optical response of incident radiation that interacts with the material being investigated.

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