Cryogenic electron microscopyCryogenic electron microscopy (cryo-EM) is a cryomicroscopy technique applied on samples cooled to cryogenic temperatures. For biological specimens, the structure is preserved by embedding in an environment of vitreous ice. An aqueous sample solution is applied to a grid-mesh and plunge-frozen in liquid ethane or a mixture of liquid ethane and propane. While development of the technique began in the 1970s, recent advances in detector technology and software algorithms have allowed for the determination of biomolecular structures at near-atomic resolution.
Electron microscopeAn electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light, electron microscopes have a higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes.
X-ray astronomyX-ray astronomy is an observational branch of astronomy which deals with the study of X-ray observation and detection from astronomical objects. X-radiation is absorbed by the Earth's atmosphere, so instruments to detect X-rays must be taken to high altitude by balloons, sounding rockets, and satellites. X-ray astronomy uses a type of space telescope that can see x-ray radiation which standard optical telescopes, such as the Mauna Kea Observatories, cannot.
X-ray binaryX-ray binaries are a class of binary stars that are luminous in X-rays. The X-rays are produced by matter falling from one component, called the donor (usually a relatively normal star), to the other component, called the accretor, which is either a neutron star or black hole. The infalling matter releases gravitational potential energy, up to 30 percent of its rest mass, as X-rays. (Hydrogen fusion releases only about 0.7 percent of rest mass.
Atomic force microscopyAtomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. Atomic force microscopy (AFM) is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
