Course

MSE-627: X-Ray Analysis for thin films

Summary

Intro into the relation between physical and structural properties; introduction into different X-Ray techniques; examples of successful technological transfer using X-Ray techniques; Structural properties; coherent and non coherent scattering; high resolution X-Ray techniques; stress; coatings.

Official source

https://edu.epfl.ch/coursebook/en/x-ray-analysis-for-thin-films-MSE-627

Moodle Page

http://go.epfl.ch/MSE-627

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