Course

MSE-659: Introduction to scanning electron microscopy microanalysis techniques

Summary

Modern Scanning Electron Microscopes, when combined with focused ion beams (Dual beam FIBs), provide a larger number of multimodal imaging and different analytical methods. The course format consists of introductory lectures, lectures on advanced techniques and practical work.

Lectures

Official source

https://edu.epfl.ch/coursebook/en/introduction-to-scanning-electron-microscopy-microanalysis-techniques-MSE-659

Moodle Page

http://go.epfl.ch/MSE-659

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