PHYS-640: Neutron and X-ray Scattering of Quantum MaterialsNNeutron and X-ray scattering are some of the most powerful and versatile experimental methods to study the structure and dynamics of materials on the atomic scale. This course covers basic theory, instrumentation and scientific applications of these experimental methods.
PHYS-462: Quantum transport in mesoscopic systemsThis course will focus on the electron transport in semiconductors, with emphasis on the mesoscopic systems. The aim is to understand the transport of electrons in low dimensional systems, where even particles with statistics different than fermions and bosons will be discussed.
MICRO-435: Quantum and nanocomputingThe course teaches non von-Neumann architectures. The first part of the course deals with quantum computing, sensing, and communications. The second focuses on field-coupled and conduction-based nanocomputing, in-memory and molecular computing, cellular automata, and spintronic computing.
MICRO-530: NanotechnologyThis course gives the basics for understanding nanotechnology from an engineer's perspective: physical background, materials aspects and scaling laws, fabrication and imaging of nanoscale devices.
PHYS-415: Particle physics IPresentation of particle properties, their symmetries and interactions.
Introduction to quantum electrodynamics and to the Feynman rules.
PHYS-470: Nonlinear optics for quantum technologiesThis course provides the fundamental knowledge and theoretical tools needed to treat nonlinear optical interactions, covering both classical and quantum theory of nonlinear optics. It presents applications such as nonclassical state generation and coherent frequency conversion.
ME-469: Nano-scale heat transferIn this course we study heat transfer (and energy conversion) from a microscopic perspective. This allows us to understand why classical laws (i.e. Fourier Law) are what they are and what are their limits of validity . We will then discuss emerging opprotunities in nanoscale devices.
MICRO-428: MetrologyThe course deals with the concept of measuring in different domains, particularly in the electrical, optical, and microscale domains. The course will end with a perspective on quantum measurements, which could trigger the ultimate revolution in metrology.
CH-633: Advanced Solid State and Surface CharacterizationState-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from thin film X-ray diffraction (GIWAXS, GISAXS, PDF), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and electron microscopy (STM, AFM, HRTEM, SEM).
