Metrology: Introduction

This lecture introduces the concept of metrology, focusing on measuring in electrical, optical, and microscale domains, with a perspective on quantum measurements. Topics covered include elements of statistics, image sensors, opto-electrical non-idealities, and quantum metrology. The instructors, Edoardo Charbon and Claudio Bruschini, provide insights into the course structure, exercise sessions, and the use of Matlab. The lecture also delves into the history of metrology, the importance of units, and the evolution of the International System of Units (SI) based on physical constants.