Explores forced external convection correlations and the procedure for solving convection problems, including the comparison of velocity and thermal boundary layers.
Covers the approximation treatments of the Boltzmann Equation for photons, phonons, and electrons, exploring diffusion and ballistic-diffuse approaches.
Covers the principles of Scanning Electron Microscopy, including SEM signals, detectors, and energy spectrum of electrons, as well as the efficiency of X-ray generation.
