This lecture discusses the implementation of correlated double sampling (CDS) directly within pixel structures of CMOS image sensors. The instructor begins by introducing the concept of a pinned photodiode and its configuration without a reset transistor. The design includes a floating diffusion with a reset transistor and a transmission gate connecting the pinned photodiode to the output diffusion. The architecture features multiple transistors within the pixel, specifically eight, to facilitate the CDS process. The instructor explains the role of the reservoirs for light intensity collection and signal processing, emphasizing the importance of the readout electronics at the column base. The lecture highlights the advantages and disadvantages of integrating CDS within the pixel, referencing a publication by Guy Meynants that provides further insights into global shutter pixels. The discussion encourages students to engage with the material and consider the implications of this design in optical detection applications.