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Introduces the basics of transmission electron microscopy, covering electron diffraction, imaging modes, specimen preparation, electron properties, and high-resolution imaging.
Covers the basics of transmission electron microscopy, including components, operation, imaging modes, diffraction analysis, and the interaction of high-energy electrons with matter.
Introduces Electron Backscatter Diffraction (EBSD) in the SEM for microstructural analysis of various materials, emphasizing sample preparation and pattern indexation.
Explores surface scattering phenomena, electron wavelength, constructive interference, organo-metallic particles, and synchrotron radiation in nanosciences.
