Spectroscopy: Electronic Properties and Techniques
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Explores the principles and applications of scanning electron microscopy in micro and nanofabrication, covering electron signals, charging issues, and dimensional measurements.
Covers X-Ray Photoelectron Spectrometry (XPS), a surface analysis technique developed by Kai Siegbahn, explaining its components, mechanism, and analysis methods.
Explores the transition from spintronics to Majorana states in proximitized materials, focusing on magnetic proximity and topological superconductivity detection.
