Lecture

PVT Variations, Uncertainty, and Monte-Carlo Simulations

Description

This lecture covers the impact of PVT variations on integrated circuits, emphasizing the uncertainties in IC design due to process, voltage, and temperature variations. It discusses the challenges of variability, worst-case design paradigms, spatial and temporal correlations of variations, and the importance of Monte-Carlo simulations in estimating parametric yield. The instructor explains the significance of global operating corners, the limitations of binning for general-purpose computing, and the analysis of very high yield using Monte-Carlo simulations.

About this result
This page is automatically generated and may contain information that is not correct, complete, up-to-date, or relevant to your search query. The same applies to every other page on this website. Please make sure to verify the information with EPFL's official sources.