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Introduces dynamical scattering in TEM, covering single and multiple elastic scattering, 2-beam diffraction, Bloch wave theory, and scattering intensity.
Explores the components and operation of Transmission Electron Microscopy, covering vacuum systems, electron emission, lens aberrations, and detector types.
Explores the components and operation of a Transmission Electron Microscope (TEM), including vacuum systems, electron sources, lenses, aberrations, and detectors.
Introduces the basics of transmission electron microscopy, covering electron diffraction, imaging modes, specimen preparation, electron properties, and high-resolution imaging.