Explores the historical development and industrial applications of radiography and computerized tomography with X-rays, gammas, and neutrons.
Covers the principles and applications of Transmission Electron Microscopy, including imaging, diffraction, contrast mechanisms, and in situ techniques.
Explores imaging modes in TEM, covering electron interactions, diffraction, contrast formation, and astigmatism correction.
Explores Transmission Electron Microscopy (TEM), covering diffraction patterns, image formation, and contrast mechanisms.
Covers the theory and formulas of diffraction, including Fresnel and Fraunhofer diffraction, integral theorems, and geometric methods.
