Covers the basics of image processing for microscopy, including acquiring, correcting defects, enhancing images, and extracting information.
Explores techniques for delineation, including Hough transform, gradient orientation, and shape detection, emphasizing the importance of combining graph-based techniques and machine learning.
Explores different types of noise in devices and circuits, including interference noise, inherent noise, and random signals.
Explores electrical metrology, covering random variables, noise sources, and their impact on electronic devices.
Covers fundamental concepts in image processing, including preprocessing techniques and matching methods.
Explores electronic, thermomechanical, and amplifier noise, calibration of amplitude, frequency tracking, and system limits.
