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Electrical Metrology
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Related lectures (32)
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CMOS Cameras: Shutter Mechanisms and Noise Sources
Covers the rolling shutter effect and noise sources in CMOS cameras, highlighting solutions for image deformation and the advantages of pinned photodiodes.
Noise in Microelectronics
Explores noise in microelectronics, covering statistical characteristics, noise spectrum impact on circuits, and noise reduction techniques.
Laser Fundamentals: Coherence and Noise
Explores laser fundamentals, including coherence and noise characteristics, such as relaxation oscillations and shot noise.
Poisson Processes: Impulsive Noise
Covers the theory of Poisson processes and impulsive noise models.
Noise in Electronic Devices
Explores thermal noise in MOS Transistors, input noise of bipolar transistors, and noise in amplifier stages, mirrors, differential pairs, and opamps.
Environmental Legislation and Construction Law
Explores environmental legislation, pollution control, noise regulations, and construction impact on the environment.
Understanding Ideal Detectors: Theory and Applications
Provides an overview of ideal detectors, focusing on their theory, noise limitations, and performance metrics in optical detection systems.
Noise Calculation in Circuits
Covers noise analysis in circuits, including small-signal and input-referred noise, with examples of amplifiers and filters.
Coherent Detection: Signal and Local Oscillator Interference
Explores coherent detection in optical systems, highlighting the interference between the signal and local oscillator.
Optical Detection: Internal Gain Analysis
Covers internal gain in optical detection systems, focusing on avalanche photodiodes and the calculations for optimal gain and signal-to-noise ratio.
