Scanning Probe Microscopy: Basics and Applications

This lecture covers the fundamentals of scanning probe microscopy, including microfabrication of nanoprobes, basics of thermal oxidation, tip sharpening by oxidation, and various types of tips used in AFM such as molded tips, focused ion beam modified tips, magnetic tips, carbon nanotube tips, and high-speed AFM. It also discusses AFM lateral force imaging, non-contact mode AFM, non-contact force microscopy, tunneling vs force in AFM, and the limitations of the most widely used AFM mode. The instructor emphasizes the importance of understanding the principles behind these techniques for successful nanoscale imaging and manipulation.