Electrical Metrology

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Related lectures (32)

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CCD Cameras: Dark Current and Noise Analysis

Covers noise sources in CCD cameras, focusing on dark current and its impact on performance.

Noise in Electronic Devices

Explores thermal noise in MOS Transistors, input noise of bipolar transistors, and noise in amplifier stages, mirrors, differential pairs, and opamps.

Noise and beam steering

Explores laser fundamentals, noise sources, and beam steering technologies using optical fibers and ultrafast lasers.

Noise Formalism in Photodetectors: Understanding Detection Limits

Discusses the formalism of noise in photodetectors, focusing on detection limits and the relationship between input power and output current.

Noise Reduction Techniques in Analog Circuits

Explores noise and offset reduction techniques in analog circuits, focusing on Autozero and Chopper Stabilization.

Small Signal Analysis: High-Speed Photodetectors

Discusses the small signal analysis of high-speed photodetectors, focusing on circuit components, noise analysis, and modeling for receiver systems.

Environmental Legislation and Construction Law

Explores environmental legislation, pollution control, noise regulations, and construction impact on the environment.

Basic Properties of Optical Detectors: Formalism and Characteristics

Discusses the fundamental properties and characteristics of optical detectors, including responsivity, quantum efficiency, and the impact of noise on detection limits.

Optical and Electronic Shot Noise: Signal to Noise Analysis

Covers optical and electronic shot noise, focusing on signal-to-noise ratio calculations and the impact of quantum efficiency on detectivity.

Noise Analysis in Optical Detectors: Key Examples

Covers examples of noise in optical detectors, including avalanche photodiodes and fluorescence correlation spectroscopy.