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Explores beam-matter interactions, focusing on emission phenomena from core electron ionization by X-Rays and electrons, and the competition between Auger and X-Rays emissions.
Introduces the basics of transmission electron microscopy, covering electron diffraction, imaging modes, specimen preparation, electron properties, and high-resolution imaging.
Covers the historical development and key components of Transmission Electron Microscopy, including electron gun, lenses, apertures, and specimen holders.
