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Lecture
Scanning Probe Microscopy: Fundamentals and Applications
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Scanning Probe Microscopy: Forces, Tips, and Probes
Explores the forces, tips, and probes used in Scanning Probe Microscopy, focusing on AFM principles, tip resolution limits, and cantilever probe fabrication.
Piezo Scanner and STM
Explores piezo scanners, STM feedback, and challenges in achieving nanometer resolution for high-quality imaging.
