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Covers X-Ray Micro-Analysis (XRMA) comparing techniques for analyzing matter with electron beams, discussing interaction volume, emission, fluorescence, and matrix effects.
Explores diffusion mechanisms in solids, including vacancy and interstitial mechanisms, correlation between jumps, and structural influences on diffusion.
Introduces Electron Backscatter Diffraction (EBSD) in the SEM for microstructural analysis of various materials, emphasizing sample preparation and pattern indexation.
