Explores dark-field microscopy, highlighting its improved contrast, high sensitivity, and potential for high-resolution imaging in various scientific fields.
Explores synchrotrons, x-ray techniques, ptychographic tomography, and laminography for high-resolution 3D reconstructions and nondestructive sample studies.
Explains insertion devices like wigglers and undulators in synchrotrons and x-ray lasers, comparing source types based on brilliance and photon energy.
Explores sinusoidal aliasing, from periodic complex exponentials to aliasing of sinusoids.
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