Lecture
X-ray Techniques and Applications
Description
This lecture covers synchrotrons, x-ray free-electron lasers, and their applications in techniques like x-ray reflectometry. It explains the Fresnel equations, roughness, Kiessig fringes, and multilayers for monitoring film growth. The lecture also discusses the determination of surface properties, interfaces, thin films, and density profiles using x-ray reflectivity.
Official source
About this result
This page is automatically generated and may contain information that is not correct, complete, up-to-date, or relevant to your search query. The same applies to every other page on this website. Please make sure to verify the information with EPFL's official sources.