Synchrotrons and X-ray Techniques

This lecture covers the principles of Laue diffraction, including diffraction geometries, basic concepts, and the overlap problem. It explores the applications of Laue diffraction in single-crystal samples and modern detectors, as well as tomography techniques. The instructor discusses the differences between Laue and Bragg diffraction geometries, the setup by Max von Laue and Friedrich Knipping, and the use of Laue diffraction in 3D. The lecture also delves into the challenges posed by the overlap problem and the extraction of Bragg-peak intensities. Finally, it showcases real-world applications of Laue diffraction in materials science and time-resolved experiments.