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Explores the principles of Scanning Transmission Electron Microscopy (STEM) for analytical microscopy, covering TEM diffraction, detectors, and EDS analysis.
Introduces dynamical scattering in TEM, covering single and multiple elastic scattering, 2-beam diffraction, Bloch wave theory, and scattering intensity.
Covers the Fourier transform, its properties, applications in signal processing, and differential equations, emphasizing the concept of derivatives becoming multiplications in the frequency domain.
