Raman Studies of FLA-Crystallized FeGe Thin Films

This lecture presents the Raman studies, microstructure, and magnetization measurements of FeGe thin films on graphene and Ge substrate. The fabrication process involves sputtering and flash lamp annealing, resulting in a combination of B20 hexagonal and monoclinic phases. The lecture covers the crystallinity and B20 phase analysis using GIXRD and Raman spectroscopy, as well as microstructure characterization through TEM and EDX. Magnetometry measurements reveal a magnetic transition below ~200 K in the FeGe films. The study aims to establish a library of Raman peaks for the B20 phase, further investigate the magnetic phase diagram, and compare high-temperature sputtering with FLA crystallization. Future work includes spin wave measurements and DFT calculations.