Lecture

Sample Preparation: Techniques and Methods

In course

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Description

This lecture covers the importance of sample preparation in electron microscopy, discussing techniques such as ion milling, mechanical polishing, and FIB. It explains the selection of suitable support grids, dispersion methods for nanoparticles, and the tripod method for lamella preparation.

Instructor

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Official source

https://mediaspace.epfl.ch/media/0_uepaqaq8

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Ontological neighbourhood

Chemical engineering

Nanotechnology: Topics in nanotechnology

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