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Covers electron microscope components, vacuum systems, aberrations, detectors, and specimen holders.

Explores the operation of a Transmission Electron Microscope, covering imaging modes and lens effects.

Covers advanced operation techniques for a Transmission Electron Microscope (TEM), including setting up the workset and fine-tuning the image.

Discusses statistical measures of central tendency and dispersion, focusing on mean, median, and their implications in data analysis.

Explores advanced techniques in transmission electron microscopy, focusing on phase contrast imaging and camera settings.

Covers the characteristics and importance of the normal distribution, including examples and treatment scenarios.