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Explores Fresnel diffraction, Fraunhofer diffraction, the Babinet principle, and optical microscope resolution, as well as near-field microscopy and SNOM/NSOM imaging.
Explores various microscopy detectors, their structures, and applications in digital imaging systems, emphasizing low-light imaging and CMOS technology advantages.
Covers the introduction to fluorescence in microscopy, labeling techniques, specificity of markers, multi-color imaging, and factors affecting fluorescence properties.