Lecture
This lecture covers strategies to combat noise sources in electronics measurements, including Johnson noise, 1/f noise, line cycle interference, and RF/EM interference. It discusses the use of lock-in amplifiers, 50 Hz notch filters, and metal enclosures to mitigate noise. The lecture also explores the Seebeck effect generating thermoelectric EMF, internal offsets in instruments, and proper grounding techniques. Practical exercises involve eliminating line noise, comparing lock-in and delta measurement methods, and implementing offset compensation for current sources.