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This lecture covers the theory of beam deflection, focusing on applications in nanotechnology. Topics include solving beam deflection through integration and superposition, AFM as a versatile tool for nanoscale biology, and the use of AFM cantilever beams for precise measurements. The instructor explains the governing differential equations for beam bending and the concept of statically indeterminate beam deflection. Examples are provided to illustrate the calculation of deflection, shear forces, bending moments, and slopes in statically indeterminate systems.